| JCM-6000 NeoScope
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| High performance system in a compact, innovative model
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 Intuitive touch panel operation with new GUI
Well focused 3D morphological observation
Backscattered electron imaging for compositional distribution
Metrology supported
Imaging of tilted, rotated samples(Optional)
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| Simple operation
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Easy touch panel operation
A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
Easy, dependable auto gun alignment (filament centering)
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| Enhanced low vacuum capability |
Enhanced quality of backscattered electron images
Easy observation of non conductive samples in the direct low vacuum mode
Only 2 minutes 30 seconds from sample loading to imaging
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| New capabilities for imaging |
Secondary electron imaging and backscattered electron imaging supported at high vacuum
Dual frame imaging to facilitate comparison of live and retrieved images
A wide magnification range from the lowest 10x for wide area of view up to 60,000x
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| A complete line of optional accessories |
Energy dispersive X-ray spectrometer
Tilt/rotation motor drive specimen holder
- A popular option, the tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.
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Element analysis
- Energy dispersive X-ray spectrometer (EDS) for elemental analysis
- JEOL's proprietary EDS
- Quick, reliable customer support guarantees satisfaction
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| Compact, light, and energy saving
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Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA
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